Submission Information

Submissions should contain original material that has not been published and nor is currently reviewed by another conference or journal. Authors are invited to submit a full paper (4-6 pages) in IEEE conference format describing their original research work (including all figures, tables and references). The paper must NOT contain authors with affiliation and must be written in English using the manuscript templates for A4 format​, accessed viahttps://www.ieee.org/conferences/publishing/templates.html. Formatting of these templates should not be altered. All submissions with go through a double-blind review process. IEEE policy requires all submissions to ACIIS2023 proceedings to be screened through a plagiarism detection software. Please ensure that the overall similarity index of your paper is less than 15%, with a single source similarity index of less than 10%. Any paper with a similarity score of more than 15% will be rejected from the review process.
 
All accepted papers will be submitted for inclusion into IEEE Digital Xplore subject to meeting IEEE’s quality standards. At least one of the authors for an accepted paper must register and present at the conference. We follow IEEE no-show policy where accepted papers that are not presented in the conference will not be included in the final proceeding and will not be submitted for inclusion in IEEE Digital Xplore.

You can submit your paper here: https://edas.info/N30962
 
Authors may contact the Program Chair or Secretary for further information or enquiries at aciis.secretariat@utb.edu.bn

PDF eXpress

Why do you need to use PDF eXpress:
All conference articles submitted for this conference must be in IEEE Xplore-compatable PDF format.

IEEE offers PDF eXpress as a free service allowing the author to make Xplore-compatible PDFs (Conversion function) or to check PDFs the author has created for Xplore compatibility (PDF Check Function).

Advantages to authors:

• It provides a means for you to convert your files to PDF, without requiring you to have access to a conversion program.
• This conversion is provided in an IEEE Xplore compatible format, without you having to worry about conversion settings.
• The system emails the converted file back to you, so you can make sure that your contribution is IEEE Xplore compatible and that no unintended corruption occurred.
• It ensures that your paper views and prints as well as possible in IEEE Xplore.
  
• By minimising the risk of post-processing problems, it reduces the amount of time it will take for your paper to appear on IEEE Xplore.
  
• It greatly simplifies the task of conforming to IEEE submission requirements.
  

Steps for creating your Xplore compliant PDF file:

1. Create your manuscript.
2. Proofread and check layout of manuscript. (It is highly recommended that you do this BEFORE going to PDF eXpress).
   
3. Create PDF eXpress account.
   
4. Upload source file(s) for Conversion; and/or PDF(s) for Checking.
   
5. Use PDF eXpress to attain Xplore-compatible PDFs. The site contains extensive instructions, resources, and helpful hints.
   
6. IMPORTANT: After finishing with the PDF eXpress web site, return to this website to submit your final, Xplore-compatible PDF(s). Submit your paper here: https://edas.info/N30962
   

Using PDF eXpress:

1. Click PDF eXpress web site.
2. Once at the PDF eXpress web site, create a new account by clicking on "New Users - Click Here" link.
   
3. Enter 59385X for the Conference ID.
   
4. Continue to enter information as prompted. You will receive an email confirming the successful creation of your account.
   
5. Through your PDF eXpress account, you may submit your source application files for conversion to PDF, and/or submit PDFs for checking. You will have the opportunity to revise your submission if you are not satisfied with the PDF that PDF eXpress creates for you, if you find mistakes in your manuscript, or if your PDF fails the PDF Check.
   
6. Technical support via email is available if you experience trouble in creating your PDF: pdfsupport@ieee.org